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Falsification of data in a paper refers to the deliberate manipulation or fabrication of research data to support a particular hypothesis or conclusion. This can include altering or omitting data, selectively reporting results, or creating false data altogether.
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Free software for EDS analysis
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Only 8$ for interpretation of your EDS spectrum
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1- DTSA-II
DTSA-II is a multi-platform software package for quantitative x-ray microanalysis. DTSA-II was inspired by the popular Desktop Spectrum Analyzer (DTSA) package d...
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How EDS works?
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Interaction of an electron beam with a sample target produces a variety of emissions, including x-rays. An energy-dispersive (EDS) detector is used to separate ...
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Fundamentals of Energy-dispersive X-ray spectroscopy (EDS)
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X-ray is a kind of electromagnetic wave, the same as light. The wavelength of visible light is 400 to 800nm, while the wavelength of x-ray is much shorter (higher en...
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What are the main differences between an SEM, an ESEM, an SEM-FIB and an (S)TEM?
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The Scanning Electron Microscope (SEM) produces images by probing the specimen with a focused electron beam that is scanned across a rectangular area of the specimen (raster scanning).
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A to Z of Atomic force microscopy (AFM)
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Atomic force microscopy (AFM) is a technique with multiple applications in biology. This method is a member of the broad family of scanning probe microscopy and was initially developed in 1986 by Binnig et al to o...
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A to Z of Energy-Dispersive X-ray Spectroscopy (EDS)
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What is EDS?
Energy-dispersive X-ray spectroscopy (also known as EDS, EDX, or EDXA) is a powerful technique that enables the user to analyze the elemental composition of a desired ...
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Analysis and interpretation of Energy-Dispersive X-Ray Spectroscopy (EDS) results
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Interaction of an electron beam with a sample target produces a variety of emissions, including x-rays. An energy-dispersive (EDS) detector is used to separate the characteristic...
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Analysis and interpretation of atomic force microscopy (AFM) results
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Only 10 $ for interpretation of your SEM/TEM/AFM micrograph
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Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times...
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The principle of Transmission Electron Microscope (TEM)
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To satisfy this curiosity, many inventions have been devised. One of them is the optical microscope. The human eye can distinguish objects down to about 0.2 mm. Optical microscopes reveal small objects, which would be other...
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